A Yield Management Strategy for Semiconductor Manufacturing Based on Information Theory
نویسندگان
چکیده
A model based on information theory, which allows technology managers to choose the optimal strategies for yield management in the semiconductor industry, is presented. The knowledge extraction rate per experimentation cycle and knowledge extraction rate per unit time serve as benchmarking metrics for yield learning. They enable managers to make objective comparisons of apparently unrelated technologies. Combinations of four yield analysis tools -electrical testing, automatic defect classification, spatial signature analysis and wafer position analysis -are examined in detail to determine an optimal yield management strategy for both the R&D and volume production environments.
منابع مشابه
Comparative Assessment of Yield Learning Tools Using Information Theory
A model based on information theory, which allows yield managers to choose the optimal strategies for yield management in microelectronic manufacturing, is presented. The data reduction rate per experimentation cycle and data reduction rate per unit time serve as benchmarking metrics for yield learning. These newly defined metrics enable managers to make objective comparisons of apparently unre...
متن کاملFrom Theory to Practice: a Total Ergonomics Model of a Manufacturing System
The objective of this paper is three fold. First, a general framework for development of total ergonomics model is introduced. Second, it is described how total ergonomics model may be applied in practice to intensify the productivity and working conditions of manufacturing systems. Third, it is shown whether the total ergonomics model is superior to the conventional ergonomics approach. This s...
متن کامل‘‘Managing’’ Learning by Doing: An Empirical Study in Semiconductor Manufacturing
This article examines the contributions of human resource and organizational practices to the development and supply chain management interface. It addresses this issue in the context of the semiconductor industry by highlighting the importance of these practices for learning-based improvement in manufacturing. One of the most important factors for competitiveness in the semiconductor industry ...
متن کاملHybrid data mining approach for pattern extraction from wafer bin map to improve yield in semiconductor manufacturing
Semiconductor manufacturing involves lengthy and complex processes, and hence is capital intensive. Companies compete with each other by continuously employing new technologies, increasing yield, and reducing costs. Yield improvement is increasingly important as advanced fabrication technologies are complicated and interrelated. In particular, wafer bin maps (WBM) that present specific failure ...
متن کاملShifting Perspective on DFM
There is one universal truth in terms of design for manufacturing (DFM)-DFM tools and disciplines have always existed. In micron technologies, manufacturing constraints were captured in process technology rule files. This process information was accessed at different levels of abstraction during various stages in the design flow. In addition, design teams implemented best practice methodologies...
متن کامل